ON THE EQUIVALENT USE OF TEM WAVEGUIDES FOR EMC MEASUREMENTS AND CALIBRATIONS| Session Chairs: | Philippe Besnier, Ramiro Serra |
The session addresses the raft of techniques that are involved in making electromagnetic compatibility measurements. The wide variety of available measurement techniques and the ever-increasing challenges faced by development and test engineers, makes the measurement and analysis of EMC phenomena a significant discipline. The scope of the session is to contribute with original research work spanning the whole spectrum of measurement techniques
8:00 E15.1 ON THE EQUIVALENT USE OF TEM WAVEGUIDES FOR EMC MEASUREMENTS AND CALIBRATIONS
D. Hamann, T. Peikert, A. S. Ostowar, H. Garbe
Electromagnetic Compatibility, Institute of Electrical Engineering and Measurement Technologies, Hannover, Germany
8:20 E15.2 COMPARISON OF COMPLEX PRINCIPAL AND INDEPENDENT COMPONENT ANALYSES OF RADIATED EMISSIONS FROM PRINTED CIRCUIT BOARDS
L. R. Arnaut, C. S. Obiekezie
George Green Institute of Electromagnetics Research, University of Nottingham, East Midlands, United Kingdom
8:40 E15.3 BROADBAND RYDBERG ATOM BASED SELF-CALIBRATING RF E-FIELD PROBE
C. Holloway, J. Gordon
NIST, Boulder, CO, United States