AD01: Metrology of Optical Frequencies and Optical-Dimensional Measuring Techniques (1)

Tuesday, August 19  08:00-09:20,  Room #18

Dimensional metrology which is now domain of laser optics represents nowadays the most dynamic branch of measurement science. Primary etalons of lengths – highly stable lasers are able to operate with relative uncertainties very close to the primary etalon of time which is at present the most precise instrument ever made. A great breakthrough into the optical metrology came with the introduction of femtosecond mode-locked lasers generating a comb of equidistantly spaced discrete optical frequencies. These frequencies are a multiplied product of the fundamental repetition frequency. Thus a bidirectional bridge between the sphere of radiofrequency and optical frequencies became possible and the idea of uniting the definition and standard of time and length came true. Measurement of geometrical quantities relies primarily on optical techniques with a highly coherent laser source. The dominant family of methods is derived form interference phenomena. This means that a highly precise wavelength generated by a laser standard is used as a scale for distance evaluation. Interferometer can be seen as an analog to the rf counter counting elements of time – it counts elements of length, single waves of spatial frequencies. A host of related techniques broaden the scope of optical metrology to other quantities, up from fundamental metrology to industrial measurements.

8:00  AD01.1   COMPUTATIONAL APPROACH TO PHASE DETECTION IN FREQUENCY-MODULATION INTERFEROMETRY

M. Sarbort, S. Rerucha, Z. Buchta, J. Lazar, O. Cip

Institute of Scientific Instruments of the ASCR, v. v. i., Brno, Czech Republic

8:20  AD01.2   POSITION SENSING WITH SUPPRESSION OF THE DRIFT OF THE REFRACTIVE INDEX OF AIR FOR HIGH RESOLUTION INTERFEROMETRY

M. Holá, Z. Buchta, O. Cip, J. Lazar

Academy of Sciences of the Czech Republic, Brno, Czech Republic

8:40  AD01.3   INTERFEROMETRY IN A PASSIVE FABRY-PEROT CAVITY WITH THE DETECTION OF A STANDING WAVE

J. Lazar¹, M. Holá¹, O. Cíp¹, J. Hrabina¹, A. Fejfar², J. Stuchlík², J. Kocka²

¹Institute of Scientific Instruments, Brno, Czech Republic
²Institute of Physics, Praha, Czech Republic

9:00  AD01.4   PSD FUNCTION A TOOL FOR NEAR-FIELD OPTICAL STUDY OF GLASS SURFACES

H. Nasrallah¹, Y. Haidar¹, S. Cherukulappurath¹, C. Dumas¹, P. Pinot², C. Zerrouki³, F. A. de Fornel¹

¹OCP, CNRS Université de Bourgogne, Dijon, France
²Masse et grandeurs associées (MGA), 2LNE- INM/CNAM, Paris, France
³Physique, CNAM, Paris, France