F08: Remote Measurement of Precipitation at Local, Regional and Global Scales (1)

Wednesday, August 20  08:00-09:20,  Room #4

Session Chairs: Chandrasekar V Chandra, Tomoo Ushio

Water is fundamental to life and civilization, therefore extensive efforts have been made to measure rainfall (or more generally precipitation which includes rain and snow) at local and global scales. Rainfall measurement at local scales has been used to study and predict flooding, and also to manage water resources; measurement at global scales has been employed to study the influence of the water cycle, as well as, its effect on energy and the environment. Fresh water availability has huge economic and societal impact. This session will cover techniques and technologies for remote measurement of precipitation at local and global scales. The session will examine the latest scientific and technological advances this area, such as dual-polarization and dual-wavelength techniques, including measurement programs for quantitative remote sensing of rainfall. Scientific advances on understanding the microphysics of precipitation will also be covered.

8:00  F08.1   MULTI-TECHNIQUE OBSERVATIONS OF CONVECTIVE RAIN EVENTS AT A TROPICAL LOCATION

A. Maitra, S. Jana, R. Chakraborty, S. Majumder

S. K. Mitra Centre for Reserach in Space Environment, Institute of Radio Physics and Electronics, University of Calcutta, Kolkata, West Bengal, India


8:20  F08.2   DUAL-FREQUENCY PRECIPITATION RADAR ESTIMATION OF RAINFALL RATE: POTENTIAL APPLICATION TO GLOBAL PRECIPITATION MISSION

M. Le, V. Chandrasekar

Colorado State University, fort collins, United States


8:40  F08.3   RAIN MICROPHYSICAL PROPERTIES BASED ON RADAR OBSERVATION IN KOREA

S. Lim1, H. Chen2, K. Lee1, B. -J. Jang1

1Korea Institute of Construction Technology, Goyang-Si, South Korea
2Colorado State University, Fort Collins, U.S.A


9:00  F08.4   DEVELOPMENT AND OBSERVATION OF THE PHASED ARRAY RADAR AT X BAND

T. Ushio1, S. Shimamura1, H. Kikuchi1, T. Wu1, T. Mega1, F. Mizutani2, M. Wada2, S. Satoh3, T. Iguchi3, E. Yoshikawa4

1Electrical, Electronics and Information Engineering, Osaka University, Osaka, Japan
2Toshiba, Tokyo, Japan
3NICT, Tokyo, Japan
4JAXA, Tokyo, Japan