E05: Stochastic Techniques in EMC (1)

Tuesday, August 19  08:00-09:20,  Room #15

The EMC community is increasingly interested in the development of analysis and design techniques which take account of the inherent uncertainty of system parameters. In fact, the system response is affected by the statistics of such parameters, and varies widely within a distribution. Typical areas of interest include effects due to unknown wave parameters of interfering signals, statistical nature of fields inside metallic enclosures, uncertainty in the location of conductors inside multiwire structures and routing of bundles in metallic enclosures, values of termination impedances, values of stray parameters and material parameters, etc. The session will address these issues and give updated information on developments in EMC characterization and testing based on statistical analysis and design techniques.

8:00  E05.1   ESTIMATION OF FAILURE PROBABILITY OF THE END INDUCED CURRENT DEPENDING ON UNCERTAIN PARAMETERS OF A TRANSMISSION LINE

M. Larbi^1,2, P. Besnier¹, B. Pecqueux²

¹Antennas and Microwave devices Department, IETR-INSA, Rennes, France
²Military Applications Division, CEA-DAM, Gramat, France

8:20  E05.2   STATISTICAL CHARACTERIZATION OF LINE-IMBALANCE IN DIFFERENTIAL LINES

X. Wu¹, Y. Yang¹, F. Grassi², G. Spadacini², S. A. Pignari²

¹State Key Laboratory of Electrical Insulation and Power Equipment, Xi'An Jiaotong University, Xi'An, P. R. China
²Dept. of Electronics, Information, and Bioengineering, Politecnico di Milano, Milan, Italy

8:40  E05.3   SAFETY ASSESSMENT OF A TRANSMISSION LINE WITH EMC REQUIREMENTS

A. Kouassi^1,2, M. Fogli², P. Bonnet¹, J. -M. Bourinet², S. Lallechère¹

¹PHOTON, Institut Pascal, Aubière, France
²MMS, Institut Pascal, Aubière, France

9:00  E05.4   Analysis of EM Emission from Cryptographic Devices

H. Sone¹, Y. -I. Hayashi², T. Mizuki¹

¹Cyberscience Center, Tohoku University, Sendai, Japan
²Graduate School of Information Sciences, Tohoku University, Sendai, Japan