A11: Nonlinear Measurements and Characterization (1)

Friday, August 22  08:00-09:20,  Room #18

Session Chairs: William Davis, Nuno Borges Carvalho

Nonlinear measurements and characteristics of devices and circuits has long been a challenge. Various attempts to define a parameter set have been suggested, but most are limited to either theoretical models or single frequency measurements. New network analyzer techniques have lead to the introduction of X-parameters that offer the basic fundamental frequency information as well as harmonic information, providing a more complete characterization of a device. For power devices, temperature dependence becomes an additional challenge. This session will focus on new developments and some classic views of nonlinear measurements.

8:00  A11.1   MIXED-SIGNAL AND MIXED-DOMAIN INSTRUMENTATION FOR EMERGING TECHNOLOGY DEVICE CHARACTERIZATION

D. Ribeiro, A. Boaventura, P. Cruz, N. Carvalho

Instituto de Telecomunicacoes - Universidade de Aveiro, Aveiro, Portugal


8:20  A11.2   CHARACTERIZATION OF HARMONIC DISTORTION AND MEMORY EFFECTS FOR RF POWER AMPLIFIERS BASED ON VOLTERRA ALGORITHM

J. Sun, M. Lin, Z. Wu

School of Electronics Information Engineering, Harbin Institute of Technology, Harbin, China


8:40  A11.3   PREDICTIVE ALGORITHM FOR DUFFING DEMODULATION SYSTEM BY KALMAN GAIN

Z. Yang, R. G. Sheng, W. Lin, S. W. Jun

Electronic Information Engineering Department, Naval Aeronautical and Astronautical University, Yantai,Shan Dong Province, China


9:00  A11.4   ENERGY ANALYSIS OF A CLASS OF NONLINEAR DETECTION SYSTEMS WITH CHAOTIC OSCILLATORS

W. Sun, G. Rui, S. Zhang

Graduate Studentsí Brigade, Naval Aeronautical and Astronautical University, Yantai, China